Electrical characterization of 180 nm ATLASPix2 HV-CMOS monolithic prototypes for the High-Luminosity LHC
نویسندگان
چکیده
منابع مشابه
Scaling equations for the accurate prediction of CMOS device performance from 180 nm to 7 nm
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ژورنال
عنوان ژورنال: Journal of Instrumentation
سال: 2020
ISSN: 1748-0221
DOI: 10.1088/1748-0221/15/05/p05022